DocumentCode :
2838681
Title :
Modeling Of Aging Of Solid Dielectric Materials In Multiple Stress Environment
Author :
Derringer, G.C. ; Epstein, M.M. ; Gaines, G.E. ; McGinniss, V.D.
Author_Institution :
Battelle Columbus Laboratories
fYear :
1979
fDate :
1-6 Apr 1979
Firstpage :
126
Lastpage :
130
Keywords :
Aging; Cable insulation; Dielectric materials; Life estimation; Power transmission; Response surface methodology; Solid modeling; Stress; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exposition, 1979. 7 IEEE/PES
Type :
conf
DOI :
10.1109/TDC.1979.712649
Filename :
712649
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2838681
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