DocumentCode
2838835
Title
Built-in self-test of the VLSI content addressable filestore
Author
Illman, R. ; Bird, T. ; Catlow, G. ; Clarke, Steven ; Theobald, L. ; Willetts, G.
fYear
1991
fDate
26-30 Oct. 1991
Firstpage
37
Lastpage
46
Abstract
The implementation of quasi-exhaustive BlST in a VLSl Content Addressable File Store (CAFS) system built from four ASIC designs and commodity memory chips is described. A novel application of BIST at the system level for improved system reliability and maintenance is discussed.
Keywords
Application specific integrated circuits; Built-in self-test; Databases; Hardware; Information retrieval; Maintenance; Read-write memory; Registers; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
Conference_Location
Nashville, TN, USA
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519492
Filename
519492
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