Title :
Built-in self-test of the VLSI content addressable filestore
Author :
Illman, R. ; Bird, T. ; Catlow, G. ; Clarke, Steven ; Theobald, L. ; Willetts, G.
Abstract :
The implementation of quasi-exhaustive BlST in a VLSl Content Addressable File Store (CAFS) system built from four ASIC designs and commodity memory chips is described. A novel application of BIST at the system level for improved system reliability and maintenance is discussed.
Keywords :
Application specific integrated circuits; Built-in self-test; Databases; Hardware; Information retrieval; Maintenance; Read-write memory; Registers; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Conference_Location :
Nashville, TN, USA
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519492
