Title :
Application Of Basic Gas Research To Practical Systems
Author :
Pace, M.O. ; Chan, C.C. ; Christophorou, L.G.
Keywords :
Charge carrier processes; Contamination; Dielectric breakdown; Dielectric liquids; Electrodes; Electrons; Laboratories; Stress; Sulfur hexafluoride; Testing;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 1979. 7 IEEE/PES
DOI :
10.1109/TDC.1979.712660
