Title :
Performability of error control schemes for NOC interconnects
Author :
Zamzam, D.M. ; Abd El Ghany, Mohamed A. ; Hofmann, Klaus
Author_Institution :
Commun. Eng. Dept., German Univ. in Cairo, Cairo, Egypt
Abstract :
High Reliability against noise, high performance and low energy consumption are major challenges facing Network on Chip (NoC). The effect of high reliable and efficient forward error correction schemes is analyzed. Interconnect Performability is introduced as a unified measure of performance and reliability. A detailed comparative analysis of different forward error correction schemes is presented using performability analytical models taking into consideration voltage swing and the impact of noise power. The results showed the proposed code Self-correction Syndrome Scheme achieved better performability by 25% and capable of achieving better performability for larger noise power.
Keywords :
energy consumption; forward error correction; integrated circuit design; integrated circuit interconnections; logic design; network-on-chip; NOC interconnects; energy consumption; error control schemes; forward error correction schemes; interconnect performability; network on chip; noise power; performability analytical models; self-correction syndrome scheme; voltage swing; Encoding; Out of order; Reliability; Error Control Coding; Interconnects; Network on Chip; Power Efficient; Reliable;
Conference_Titel :
NORCHIP, 2012
Conference_Location :
Cpenhagen
Print_ISBN :
978-1-4673-2221-8
Electronic_ISBN :
978-1-4673-2222-5
DOI :
10.1109/NORCHP.2012.6403123
