DocumentCode
2839410
Title
Anomalous reactivity of InAs-deposited GaAs surfaces
Author
Sasaki, Masahiro ; Yamamoto, Shigehiko
Author_Institution
Inst. of Appl. Phys., Tsukuba Univ., Ibaraki, Japan
fYear
1998
fDate
11-15 May 1998
Firstpage
579
Lastpage
582
Abstract
We examine the surface reactivity of InAs-covered GaAs(100) surfaces as a function of surface InAs coverage using trimethylgallium (TMG) as a probe molecule, which is a typical source material for the epitaxial growth methods of compound semiconductors. We find an anomalous behaviour of the dependence of TMG decomposition rate; the surface decomposition rate is not determined simply by the fraction of the surface covering elements. TMG decomposition rate on the InAs-covered GaAs (100) surface is constant and close to that on the clean GaAs surfaces as far as the two-dimensional growth is maintained, even when the surface is fully covered with InAs. The results are discussed on the basis of the surface structure
Keywords
III-V semiconductors; dissociation; gallium arsenide; indium compounds; mass spectroscopic chemical analysis; molecular beam epitaxial growth; semiconductor growth; surface chemistry; GaAs; InAs-GaAs; InAs-deposited GaAs surfaces; TMG decomposition rate; anomalous reactivity; compound semiconductors; epitaxial growth methods; surface InAs coverage; surface covering elements; surface decomposition rate; surface reactivity; surface structure; trimethylgallium; two-dimensional growth; Epitaxial growth; Gallium arsenide; Intrusion detection; Mass spectroscopy; Optical scattering; Substrates; Surface cleaning; Surface reconstruction; Surface structures; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location
Tsukuba
ISSN
1092-8669
Print_ISBN
0-7803-4220-8
Type
conf
DOI
10.1109/ICIPRM.1998.712688
Filename
712688
Link To Document