Title :
Functional Built-In Self-Test for processor cores in SoC
Author :
Ubar, Raimund ; Indus, V. ; Kalmend, O. ; Evartson, T. ; Orasson, E.
Author_Institution :
Dept. of Comput. Eng., TTU, Tallinn, Estonia
Abstract :
A methodology for organization of at-speed functional Built-In Self-Test in processors, based on real functional routines is presented. The proposed self-test includes on-chip test application and response collection by using the functionality of the processor under test. We use divide-and-conquer approach. At component level, tests are targeting faults in components. At processor level, the functionality of the processor is used to apply functional test patterns to each component at-speed. Differently from usual Built-in Self-Test schemes, the test patterns are not needed to store in the chip under test, they will be generated on-line by the resources of the system.
Keywords :
built-in self test; system-on-chip; SoC; at-speed functional built-in self-test; divide-and-conquer approach; processor cores; response collection; Built-in self-test; Discrete Fourier transforms; Hybrid power systems; Iron;
Conference_Titel :
NORCHIP, 2012
Conference_Location :
Cpenhagen
Print_ISBN :
978-1-4673-2221-8
Electronic_ISBN :
978-1-4673-2222-5
DOI :
10.1109/NORCHP.2012.6403148
