DocumentCode
2839516
Title
Material synthesis routes for thin film bonding interfaces in reworkable and bumpless nano-interconnects
Author
Aggarwal, Ankur O. ; Raj, P. Markondeya ; Abothu, Isaac R. ; Ravi, D. ; Sacks, Michael D. ; Tay, Andrew A O ; Tummala, Rao R.
Author_Institution
NSF Microsystems Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2004
fDate
2004
Firstpage
69
Lastpage
73
Abstract
This work explores novel material synthesis routes towards reworkable nano-dimensional interfaces for IC-package assembly, leading to bumpless and nano interconnections. Reworkability is addressed by a thin interface of lead-free high-strength solders. Two approaches, sol-gel process and electroless plating, were used to achieve these nano-dimensional bonding interfaces. In the sol-gel process, metal-organic polymer solutions were heat-treated in a reducing atmosphere at 400°C to form lead-free solders (Sn-Ag-Cu). In the electroless plating approach, lead-free alloy films were deposited from aqueous plating solutions consisting of suitable metal salts and reducing agents. This process was done at a temperature of 45°C. The lead-free solder composition was controlled by altering the plating bath formulation. Solder films formed from both the above approaches were demonstrated to bond copper pads. Solution-derived nano-solder technology is an attractive low-cost method for bumpless nano-interconnects and other applications such as MEMS hermetic packaging and compliant interconnect bonding.
Keywords
copper alloys; electroless deposition; integrated circuit bonding; integrated circuit interconnections; integrated circuit packaging; nanoelectronics; silver alloys; sol-gel processing; solders; tin alloys; 400 degC; 45 degC; IC-package assembly; MEMS hermetic packaging; SnAgCu; bumpless nano-interconnects; compliant interconnect bonding; electroless plating; lead-free high strength solders; nano-dimensional bonding interfaces; reworkable nano-interconnects; sol-gel process; solder films; solution-derived nanosolder technology; thin film bonding interfaces; Assembly; Atmosphere; Bonding; Copper; Environmentally friendly manufacturing techniques; Lead; Micromechanical devices; Polymers; Temperature; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials: Processes, Properties and Interfaces, 2004. Proceedings. 9th International Symposium on
Print_ISBN
0-7803-8436-9
Type
conf
DOI
10.1109/ISAPM.2004.1287991
Filename
1287991
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