• DocumentCode
    2839552
  • Title

    Luminescence study on GaInP doped with Er by OMVPE

  • Author

    Fujiwara, Y. ; Ito, T. ; Kawamoto, T. ; Takeda, Y.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nagoya Univ., Japan
  • fYear
    1998
  • fDate
    11-15 May 1998
  • Firstpage
    603
  • Lastpage
    606
  • Abstract
    Er-related photoluminescence due to intra-4f shell transitions of Er3+ ions has successfully been observed in GaInP doped with Er by OMVPE. In GaInP grown on GaP and InP, the luminescence intensity increased gradually with increasing Ga composition, while the spectral shape was invariant. In GaInP grown on GaAs, the luminescence spectrum was dominated by three emission lines whose relative intensity depended on the Ga composition. Thermal quenching of the Er-related luminescence became gradually small with increasing Ga composition, i.e., increasing band gap, which reflects deep-level properties of Er in excitation mechanism of the 4f shell
  • Keywords
    III-V semiconductors; MOCVD coatings; erbium; gallium compounds; indium compounds; photoluminescence; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; GaInP:Er; OMVPE; band gap; deep-level properties; emission lines; gap; intra-4f shell transitions; luminescence intensity; photoluminescence; Erbium; Gallium arsenide; III-V semiconductor materials; Indium phosphide; Inductors; Luminescence; Optical fiber communication; Photoluminescence; Photonic band gap; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1998 International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-4220-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1998.712694
  • Filename
    712694