DocumentCode
2839967
Title
High-density logic techniques with reduced-stack double-gate MOSFETs
Author
Chiang, Meng-Hsueh ; Kim, Keunwoo ; Chuang, Ching-Te ; Tretz, Christophe
Author_Institution
National Ilan Univ., Taiwan
fYear
2005
fDate
3-6 Oct. 2005
Firstpage
85
Lastpage
86
Abstract
We have presented a high-density DG logic circuit technique exploiting the unique VT modulation effect through the extended gate-to-gate coupling in high-VT symmetrical DG devices. The scheme reduces the number of stacked transistors (hence area/capacitance and standby/dynamic power), and improves performance. The performance improvement and power reduction are evaluated/validated using mixed-mode two-dimensional numerical simulations.
Keywords
MOSFET; integrated circuit design; logic design; logic gates; 2D numerical simulations; DG logic circuit technique; double-gate MOSFET; gate-to-gate coupling; high-density logic techniques; modulation effect; symmetrical DG devices; CMOS technology; Design engineering; Logic circuits; Logic design; Logic devices; Logic functions; Logic gates; MOSFETs; Numerical simulation; Performance analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 2005. Proceedings. 2005 IEEE International
ISSN
1078-621X
Print_ISBN
0-7803-9212-4
Type
conf
DOI
10.1109/SOI.2005.1563544
Filename
1563544
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