• DocumentCode
    2840478
  • Title

    Lateral integration of partially insulated and bulk MOSFETs using partial SOI process

  • Author

    Kim, Sung Hwan ; Oh, Chang Woo ; Yeo, Kyoung Hwan ; Choi, Dong Uk ; Kim, Min Sang ; Kim, Sung Min ; Choe, Jeong Dong ; Han, Jeongnam ; Kim, Young-Pil ; Kim, Dong-Won ; Park, Donggun ; Ryu, Byung-Il

  • Author_Institution
    R&D Center, Samsung Electron. Co., Yongin, South Korea
  • fYear
    2005
  • fDate
    3-6 Oct. 2005
  • Firstpage
    174
  • Lastpage
    175
  • Abstract
    We proposed and successfully demonstrated partially insulated and bulk MOSFETs with multiple Vths, Ions, and IOffs by using partial SOI process without complex process and SOI wafer. Both nMOS and pMOS applicable to the HP and LSTP transistors were simultaneously implemented on the same wafer with the same process except partial SOI process. These results must be very useful to implement IC systems requiring various specifications of VTHs, IOns, and IOffs.
  • Keywords
    MOSFET; silicon-on-insulator; HP transistors; LSTP transistors; bulk MOSFET; nMOS transistor; pMOS transistor; partial SOI process; partially insulated MOSFET; Electric variables; Epitaxial growth; Etching; Fabrication; Germanium silicon alloys; Insulation; MOSFETs; Silicon germanium; Silicon on insulator technology; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 2005. Proceedings. 2005 IEEE International
  • ISSN
    1078-621X
  • Print_ISBN
    0-7803-9212-4
  • Type

    conf

  • DOI
    10.1109/SOI.2005.1563578
  • Filename
    1563578