Title :
Lateral integration of partially insulated and bulk MOSFETs using partial SOI process
Author :
Kim, Sung Hwan ; Oh, Chang Woo ; Yeo, Kyoung Hwan ; Choi, Dong Uk ; Kim, Min Sang ; Kim, Sung Min ; Choe, Jeong Dong ; Han, Jeongnam ; Kim, Young-Pil ; Kim, Dong-Won ; Park, Donggun ; Ryu, Byung-Il
Author_Institution :
R&D Center, Samsung Electron. Co., Yongin, South Korea
Abstract :
We proposed and successfully demonstrated partially insulated and bulk MOSFETs with multiple Vths, Ions, and IOffs by using partial SOI process without complex process and SOI wafer. Both nMOS and pMOS applicable to the HP and LSTP transistors were simultaneously implemented on the same wafer with the same process except partial SOI process. These results must be very useful to implement IC systems requiring various specifications of VTHs, IOns, and IOffs.
Keywords :
MOSFET; silicon-on-insulator; HP transistors; LSTP transistors; bulk MOSFET; nMOS transistor; pMOS transistor; partial SOI process; partially insulated MOSFET; Electric variables; Epitaxial growth; Etching; Fabrication; Germanium silicon alloys; Insulation; MOSFETs; Silicon germanium; Silicon on insulator technology; Substrates;
Conference_Titel :
SOI Conference, 2005. Proceedings. 2005 IEEE International
Print_ISBN :
0-7803-9212-4
DOI :
10.1109/SOI.2005.1563578