DocumentCode :
2840535
Title :
A DESIGN-FOR-TESTABILITY ARCHITECTURE FOR MULTICHIP MODULES
Author :
Posse, Kenneth E.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
113
Keywords :
Automatic testing; Circuit faults; Circuit testing; Delay; Dielectric substrates; Fault detection; Logic testing; Manufacturing; Multichip modules; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519501
Filename :
519501
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2840535
