• DocumentCode
    2840535
  • Title

    A DESIGN-FOR-TESTABILITY ARCHITECTURE FOR MULTICHIP MODULES

  • Author

    Posse, Kenneth E.

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    113
  • Keywords
    Automatic testing; Circuit faults; Circuit testing; Delay; Dielectric substrates; Fault detection; Logic testing; Manufacturing; Multichip modules; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519501
  • Filename
    519501
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2840535