DocumentCode
2840694
Title
Air-Sea Interaction Profiler: Autonomous upper ocean measurements
Author
Ward, Brian ; Fristedt, Tim
Author_Institution
Sch. of Phys., Nat. Univ. of Ireland, Galway
fYear
2008
fDate
27-29 May 2008
Firstpage
1
Lastpage
8
Abstract
The Air-Sea Interaction Profiler (ASIP) is an autonomous profiling instrument for upper ocean measurements. The measurements from ASIP are well suited to enhancing research on air-sea interfacial and near surface processes. Autonomous profiling is accomplished with a thruster, which submerges ASIP to a programmed depth. Once this depth is reached the positively buoyant instrument will ascend to the surface acquiring data. ASIP can profile from a maximum depth of 100 m to the surface, allowing both mixed layer and near-surface measurements to be conducted. The sensor payload on ASIP include microstructure sensors (two shear probes and a thermistor); a slow response accurate thermometer; a pair of conductivity sensors; pressure for a record of depth; PAR for measurements of light absorption in the water column. Other non-environmental sensors are acceleration, rate, and heading for determination of vehicle motion. Power is provided with rechargable lithium-ion batteries, supplying 1000 W hr, allowing approximately 300 profiles. ASIP also contains an Iridium/GPS system, which allows realtime reporting of its position.
Keywords
light absorption; oceanographic equipment; secondary cells; sensor arrays; Air-Sea Interaction Profiler; Iridium/GPS system; PAR; air-sea interfacial process; autonomous upper ocean measurements; conductivity sensors; light absorption measurement; lithium-ion batteries; microstructure sensors; mixed layer; near surface process; positively buoyant instrument; pressure recorder; sensor payload; shear probes; slow response accurate thermometer; thermistor; vehicle motion; Application specific processors; Instruments; Microstructure; Ocean temperature; Payloads; Probes; Sea measurements; Sea surface; Thermal sensors; Thermistors;
fLanguage
English
Publisher
ieee
Conference_Titel
US/EU-Baltic International Symposium, 2008 IEEE/OES
Conference_Location
Tallinn
Print_ISBN
978-1-4244-2267-8
Electronic_ISBN
978-1-4244-2268-5
Type
conf
DOI
10.1109/BALTIC.2008.4625494
Filename
4625494
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