• DocumentCode
    2840858
  • Title

    Errors in Secondary Readings of CTP-Profilers, Caused by Random Deviation and Transient Response

  • Author

    Hinkelmann, H. ; Ihme, H.M.

  • Author_Institution
    Institut für Angewandte Physik der Universität Kiel, Kiel, Germany
  • fYear
    1976
  • fDate
    13-15 Sept. 1976
  • Firstpage
    514
  • Lastpage
    517
  • Abstract
    Conductivity, temperature and pressure profiling instruments usually being fitted with the best of available sensors, differences of readings with laboratory tests or intercalibration in sufficiently homogeneous water are merely a question of calibration, not of quality. Even in areas of very homogeneous deep water one finds random deviations of water properties much larger than the tolerance of measuring and calculation, and larger with the primary readings C , T and P than with the secondary ones \\delta and S. These deviations give rise to additional large errors in the secondary readings, caused by the different transient responses of the sensors, and by the way to get the primary readings from the output of the sensors. By computer simulation it was found, that 0.01\\deg C random deviation and a certain thermometer cause 0.8\\cdotp10^{-5} ruggedness of \\delta with a sampling system. With an averaging system the value is 0.5\\cdotp10^{-5} and can easily be reduced to 0.25\\cdotp10^{-5} .
  • Keywords
    Circuits; Frequency conversion; Ocean temperature; Sampling methods; Sea measurements; Sensor phenomena and characterization; Sensor systems; Temperature sensors; Thermal sensors; Water;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    OCEANS '76
  • Conference_Location
    Washington, DC, USA
  • Type

    conf

  • DOI
    10.1109/OCEANS.1976.1154281
  • Filename
    1154281