DocumentCode :
2840858
Title :
Errors in Secondary Readings of CTP-Profilers, Caused by Random Deviation and Transient Response
Author :
Hinkelmann, H. ; Ihme, H.M.
Author_Institution :
Institut für Angewandte Physik der Universität Kiel, Kiel, Germany
fYear :
1976
fDate :
13-15 Sept. 1976
Firstpage :
514
Lastpage :
517
Abstract :
Conductivity, temperature and pressure profiling instruments usually being fitted with the best of available sensors, differences of readings with laboratory tests or intercalibration in sufficiently homogeneous water are merely a question of calibration, not of quality. Even in areas of very homogeneous deep water one finds random deviations of water properties much larger than the tolerance of measuring and calculation, and larger with the primary readings C , T and P than with the secondary ones \\delta and S. These deviations give rise to additional large errors in the secondary readings, caused by the different transient responses of the sensors, and by the way to get the primary readings from the output of the sensors. By computer simulation it was found, that 0.01\\deg C random deviation and a certain thermometer cause 0.8\\cdotp10^{-5} ruggedness of \\delta with a sampling system. With an averaging system the value is 0.5\\cdotp10^{-5} and can easily be reduced to 0.25\\cdotp10^{-5} .
Keywords :
Circuits; Frequency conversion; Ocean temperature; Sampling methods; Sea measurements; Sensor phenomena and characterization; Sensor systems; Temperature sensors; Thermal sensors; Water;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
OCEANS '76
Conference_Location :
Washington, DC, USA
Type :
conf
DOI :
10.1109/OCEANS.1976.1154281
Filename :
1154281
Link To Document :
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