DocumentCode
2840858
Title
Errors in Secondary Readings of CTP-Profilers, Caused by Random Deviation and Transient Response
Author
Hinkelmann, H. ; Ihme, H.M.
Author_Institution
Institut für Angewandte Physik der Universität Kiel, Kiel, Germany
fYear
1976
fDate
13-15 Sept. 1976
Firstpage
514
Lastpage
517
Abstract
Conductivity, temperature and pressure profiling instruments usually being fitted with the best of available sensors, differences of readings with laboratory tests or intercalibration in sufficiently homogeneous water are merely a question of calibration, not of quality. Even in areas of very homogeneous deep water one finds random deviations of water properties much larger than the tolerance of measuring and calculation, and larger with the primary readings
,
and
than with the secondary ones
and S. These deviations give rise to additional large errors in the secondary readings, caused by the different transient responses of the sensors, and by the way to get the primary readings from the output of the sensors. By computer simulation it was found, that
C random deviation and a certain thermometer cause
ruggedness of
with a sampling system. With an averaging system the value is
and can easily be reduced to
.
,
and
than with the secondary ones
and S. These deviations give rise to additional large errors in the secondary readings, caused by the different transient responses of the sensors, and by the way to get the primary readings from the output of the sensors. By computer simulation it was found, that
C random deviation and a certain thermometer cause
ruggedness of
with a sampling system. With an averaging system the value is
and can easily be reduced to
.Keywords
Circuits; Frequency conversion; Ocean temperature; Sampling methods; Sea measurements; Sensor phenomena and characterization; Sensor systems; Temperature sensors; Thermal sensors; Water;
fLanguage
English
Publisher
ieee
Conference_Titel
OCEANS '76
Conference_Location
Washington, DC, USA
Type
conf
DOI
10.1109/OCEANS.1976.1154281
Filename
1154281
Link To Document