DocumentCode
2841100
Title
Orientational dependence of `true´ SC-cuts [crystal resonator]
Author
EerNisse, Errol P. ; Kusters, John A.
Author_Institution
Quartztronics, Inc., Salt Lake City, UT, USA
fYear
1990
fDate
23-25 May 1990
Firstpage
185
Lastpage
192
Abstract
An experimental matrix method for defining the best crystallographic orientation for a specific mounting and packaging configuration is presented. The theoretical background is discussed. Some experimental evidence is reviewed. It is found that to achieve the maximum benefits, both static stress compensation for planar effects, and thermal transient compensation for planar and non-planar thermal effects are required. The methods for testing resonators and choosing the correct φ angle are presented
Keywords
compensation; crystal orientation; crystal resonators; packaging; φ angle; crystal resonator; crystallographic orientation; experimental matrix; mounting; nonplanar thermal effects; packaging; planar effects; static stress compensation; testing; thermal effects; thermal transient compensation; Cities and towns; Crystalline materials; Electrodes; Geometry; Graphics; Manufacturing; Packaging; Resonant frequency; Temperature; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control, 1990., Proceedings of the 44th Annual Symposium on
Conference_Location
Baltimore, MD
Type
conf
DOI
10.1109/FREQ.1990.177496
Filename
177496
Link To Document