Title :
CMOS open fault detection by appearance time of switching supply current
Author :
Hashizume, Masaki ; Akita, Tetsuo ; Yotsuyanagi, Hiroyuki ; Tamesada, Takeomi
Author_Institution :
Fac. of Eng., Tokushima Univ., Japan
Abstract :
In this paper, a new dynamic supply current test method is proposed for detecting open defects on signal lines in CMOS logic circuits. The method is based on the appearance time of dynamic supply current that flows when a test input vector is provided to a circuit under test. Also, we introduce our designed sensor circuit of the appearance time. Feasibility of tests based on the test method is examined by some experiments. The experimental results show that open defects on signal lines in CMOS logic circuits will be detected by the test method.
Keywords :
CMOS logic circuits; fault diagnosis; integrated circuit testing; CMOS logic circuits; CMOS open fault detection; feasibility; open defects; sensor circuit; signal lines; supply current test method; switching supply current; test input vector; CMOS logic circuits; Circuit faults; Circuit testing; Current supplies; Delay; Electrical fault detection; Fault detection; Integrated circuit modeling; Logic testing; Semiconductor device modeling;
Conference_Titel :
Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
Conference_Location :
Perth, WA, Australia
Print_ISBN :
0-7695-2081-2
DOI :
10.1109/DELTA.2004.10036
