مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2841289

Title :

TEST GRADING THE 68332

Author :

Cheng, Tony ; Hoang, Eric ; Rivera, David ; Haedge, Alan ; Fontenot, Jamie ; Carson, Glenn

fYear :

1991

fDate :

26-30 Oct 1991

Firstpage :

150

Keywords :

Automatic test pattern generation; Central Processing Unit; Design for testability; Logic testing; Manufacturing; Microcontrollers; Microprocessors; Performance evaluation; Pins; Productivity;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1991, Proceedings., International

ISSN :

1089-3539

Print_ISBN :

0-8186-9156-5

Type :

conf

DOI :

10.1109/TEST.1991.519505

Filename :

519505

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2841289