• DocumentCode
    2841339
  • Title

    Statistical process control for frequency control

  • Author

    Thomas, Bill

  • Author_Institution
    Rockwell Int. Corp., Cedar Rapids, IA, USA
  • fYear
    1990
  • fDate
    23-25 May 1990
  • Firstpage
    285
  • Lastpage
    293
  • Abstract
    Some possibilities of using statistical process control (SPC) tools to improve the accuracy, precision and quality of frequency control are discussed. The tools presented are process flow charts, Pareto charts, cause and effect charts, histograms, scatter diagrams/regression, control charts and experiments in the control of frequency standard processes. Some of the major variables considered are crystals, thermistors, selastic, and workmanship. Their relationships to frequency stability are studied. No experimental work has been done. A few approaches to studying frequency control using the preventative method of SPC are discussed. The major emphasis is on reducing the variation of the frequency stability by studying variation and being able to sort out the signal (assignable causes) from the noise (random causes). Some specific items included are when and how to look at the distributions of the data along with when and how to look at the data over time
  • Keywords
    crystal resonators; frequency control; frequency stability; quartz; statistical process control; Pareto charts; SiO2 crystal resonators; assignable causes; cause and effect charts; control charts; crystals; experiments; frequency control; frequency stability; frequency standard processes; histograms; preventative method; process flow charts; random causes; scatter diagrams/regression; selastic; statistical process control; thermistors; variables; workmanship; Control charts; Crystals; Flowcharts; Frequency control; Histograms; Process control; Scattering; Stability; Thermal variables control; Thermistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control, 1990., Proceedings of the 44th Annual Symposium on
  • Conference_Location
    Baltimore, MD
  • Type

    conf

  • DOI
    10.1109/FREQ.1990.177509
  • Filename
    177509