• DocumentCode
    2841345
  • Title

    Research on etching blind holes and desmear with plasma

  • Author

    Yu, Xiaofei ; He, Wei ; Wang, Shouxu ; Zhou, Guoyun ; Zhu, Meng

  • Author_Institution
    Sch. of Microelectron. & Solid-State Electron, UESTC, Chengdu, China
  • fYear
    2011
  • fDate
    19-21 Oct. 2011
  • Firstpage
    304
  • Lastpage
    306
  • Abstract
    Plasma has a special advantage in cleaning micro blind holes due to simple process, easily operate and non-pollution. In this paper, different etching rates of materials include epoxy, polyimide(PI) and acrylic aid were obtained by cleaning blind holes with plasma in the same condition. The relationship between plasma parameters and etching depths of PI were discussed through orthogonal experimental design (OED). The effects of etching blind holes were investigated through metallographic cross section. Blind holes in a double-side flexible printed circuit(FPC) with PI materials were successfully obtained by plasma etching process.
  • Keywords
    flexible electronics; printed circuit design; sputter etching; OED; etching rates; flexible printed circuit; micro blind holes; orthogonal experimental design; plasma etching; Cleaning; Copper; Etching; Helium; Plasmas; Presses; OED; blind hole; micro via cleaning; plasma;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4577-1387-3
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2011.6117162
  • Filename
    6117162