DocumentCode
2841345
Title
Research on etching blind holes and desmear with plasma
Author
Yu, Xiaofei ; He, Wei ; Wang, Shouxu ; Zhou, Guoyun ; Zhu, Meng
Author_Institution
Sch. of Microelectron. & Solid-State Electron, UESTC, Chengdu, China
fYear
2011
fDate
19-21 Oct. 2011
Firstpage
304
Lastpage
306
Abstract
Plasma has a special advantage in cleaning micro blind holes due to simple process, easily operate and non-pollution. In this paper, different etching rates of materials include epoxy, polyimide(PI) and acrylic aid were obtained by cleaning blind holes with plasma in the same condition. The relationship between plasma parameters and etching depths of PI were discussed through orthogonal experimental design (OED). The effects of etching blind holes were investigated through metallographic cross section. Blind holes in a double-side flexible printed circuit(FPC) with PI materials were successfully obtained by plasma etching process.
Keywords
flexible electronics; printed circuit design; sputter etching; OED; etching rates; flexible printed circuit; micro blind holes; orthogonal experimental design; plasma etching; Cleaning; Copper; Etching; Helium; Plasmas; Presses; OED; blind hole; micro via cleaning; plasma;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4577-1387-3
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2011.6117162
Filename
6117162
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