DocumentCode :
2841345
Title :
Research on etching blind holes and desmear with plasma
Author :
Yu, Xiaofei ; He, Wei ; Wang, Shouxu ; Zhou, Guoyun ; Zhu, Meng
Author_Institution :
Sch. of Microelectron. & Solid-State Electron, UESTC, Chengdu, China
fYear :
2011
fDate :
19-21 Oct. 2011
Firstpage :
304
Lastpage :
306
Abstract :
Plasma has a special advantage in cleaning micro blind holes due to simple process, easily operate and non-pollution. In this paper, different etching rates of materials include epoxy, polyimide(PI) and acrylic aid were obtained by cleaning blind holes with plasma in the same condition. The relationship between plasma parameters and etching depths of PI were discussed through orthogonal experimental design (OED). The effects of etching blind holes were investigated through metallographic cross section. Blind holes in a double-side flexible printed circuit(FPC) with PI materials were successfully obtained by plasma etching process.
Keywords :
flexible electronics; printed circuit design; sputter etching; OED; etching rates; flexible printed circuit; micro blind holes; orthogonal experimental design; plasma etching; Cleaning; Copper; Etching; Helium; Plasmas; Presses; OED; blind hole; micro via cleaning; plasma;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4577-1387-3
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2011.6117162
Filename :
6117162
Link To Document :
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