DocumentCode :
2841412
Title :
Microsystem development using the TQM design methodology
Author :
Rucinski, Andrzej ; Skrygulec, Artur ; Pysareva, Khrystyna ; Mocny, Jakub
Author_Institution :
Dept. of Electr. & Comput. Eng., New Hampshire Univ., Durham, NH, USA
fYear :
2004
fDate :
28-30 Jan. 2004
Firstpage :
225
Lastpage :
230
Abstract :
Equilibrium between technology for microelectronic systems and their theory is constantly sought. However, it appears that technology advances are ahead of their underlying theory. The paper describes formalism for the development of microelectronic systems, called microsystems, to include mechanical and optoelectronic components that restore the necessary balance. Using this formalism, we introduce a TQM design methodology to emphasize the importance of integrated design, test, and reliability. The methodology is illustrated using a microsystem developed for biometrics applications.
Keywords :
biometrics (access control); integrated optoelectronics; micromechanical devices; reliability; total quality management; TQM design methodology; biometrics; integrated design; mechanical components; microelectronic systems; microsystem development; optoelectronic components; reliability; total quality management; Biometrics; Contacts; Continuous improvement; Design for testability; Design methodology; Electrical equipment industry; Microelectronics; Process design; Testing; Total quality management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
Conference_Location :
Perth, WA, Australia
Print_ISBN :
0-7695-2081-2
Type :
conf
DOI :
10.1109/DELTA.2004.10056
Filename :
1409844
Link To Document :
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