DocumentCode
2841412
Title
Microsystem development using the TQM design methodology
Author
Rucinski, Andrzej ; Skrygulec, Artur ; Pysareva, Khrystyna ; Mocny, Jakub
Author_Institution
Dept. of Electr. & Comput. Eng., New Hampshire Univ., Durham, NH, USA
fYear
2004
fDate
28-30 Jan. 2004
Firstpage
225
Lastpage
230
Abstract
Equilibrium between technology for microelectronic systems and their theory is constantly sought. However, it appears that technology advances are ahead of their underlying theory. The paper describes formalism for the development of microelectronic systems, called microsystems, to include mechanical and optoelectronic components that restore the necessary balance. Using this formalism, we introduce a TQM design methodology to emphasize the importance of integrated design, test, and reliability. The methodology is illustrated using a microsystem developed for biometrics applications.
Keywords
biometrics (access control); integrated optoelectronics; micromechanical devices; reliability; total quality management; TQM design methodology; biometrics; integrated design; mechanical components; microelectronic systems; microsystem development; optoelectronic components; reliability; total quality management; Biometrics; Contacts; Continuous improvement; Design for testability; Design methodology; Electrical equipment industry; Microelectronics; Process design; Testing; Total quality management;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
Conference_Location
Perth, WA, Australia
Print_ISBN
0-7695-2081-2
Type
conf
DOI
10.1109/DELTA.2004.10056
Filename
1409844
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