• DocumentCode
    2841412
  • Title

    Microsystem development using the TQM design methodology

  • Author

    Rucinski, Andrzej ; Skrygulec, Artur ; Pysareva, Khrystyna ; Mocny, Jakub

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Hampshire Univ., Durham, NH, USA
  • fYear
    2004
  • fDate
    28-30 Jan. 2004
  • Firstpage
    225
  • Lastpage
    230
  • Abstract
    Equilibrium between technology for microelectronic systems and their theory is constantly sought. However, it appears that technology advances are ahead of their underlying theory. The paper describes formalism for the development of microelectronic systems, called microsystems, to include mechanical and optoelectronic components that restore the necessary balance. Using this formalism, we introduce a TQM design methodology to emphasize the importance of integrated design, test, and reliability. The methodology is illustrated using a microsystem developed for biometrics applications.
  • Keywords
    biometrics (access control); integrated optoelectronics; micromechanical devices; reliability; total quality management; TQM design methodology; biometrics; integrated design; mechanical components; microelectronic systems; microsystem development; optoelectronic components; reliability; total quality management; Biometrics; Contacts; Continuous improvement; Design for testability; Design methodology; Electrical equipment industry; Microelectronics; Process design; Testing; Total quality management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
  • Conference_Location
    Perth, WA, Australia
  • Print_ISBN
    0-7695-2081-2
  • Type

    conf

  • DOI
    10.1109/DELTA.2004.10056
  • Filename
    1409844