• DocumentCode
    2841580
  • Title

    New method of fault feature extraction based on supervised LLE

  • Author

    Jiang, Quansheng ; Lu, Jiayun ; Jia, Minping

  • Author_Institution
    Dept. of Phys., Chaohu Univ., Chaohu, China
  • fYear
    2010
  • fDate
    26-28 May 2010
  • Firstpage
    1727
  • Lastpage
    1731
  • Abstract
    The Locally Linear Embedding (LLE) is one of the efficient nonlinear dimensionality reduction techniques, which can be used to fault feature extraction. But it is not taking the class information of the data into account. In this paper, we propose a novel approach of feature extraction based on supervised LLE algorithm. Via utilizing class information to guide the procedure of nonlinear mapping, the Supervised LLE enhances local within-class relations and help to classification. The approach uses the Supervised LLE to extract feature for class labels data, and utilizes RBF network to map the unlabeled data to the feature space, which easily implement fault pattern classification. The experiments on benchmark dataset and engineering instance demonstrate that, the proposed approach excels compared to PCA and LLE, and it is an accurate technique for classification.
  • Keywords
    feature extraction; learning (artificial intelligence); pattern classification; radial basis function networks; RBF network; fault feature extraction; fault pattern classification; local within-class relations; locally linear embedding technique; nonlinear dimensionality reduction techniques; radial basis function network; supervised LLE technique; Artificial intelligence; Chaos; Feature extraction; Laplace equations; Learning systems; Linear discriminant analysis; Machine intelligence; Machinery; Pattern classification; Principal component analysis; Feature extraction; Nonlinear dimensionality reduction; Supervised LLE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference (CCDC), 2010 Chinese
  • Conference_Location
    Xuzhou
  • Print_ISBN
    978-1-4244-5181-4
  • Electronic_ISBN
    978-1-4244-5182-1
  • Type

    conf

  • DOI
    10.1109/CCDC.2010.5498459
  • Filename
    5498459