• DocumentCode
    2841751
  • Title

    An overview of the open architecture test system

  • Author

    Rajsuman, Rochit

  • Author_Institution
    Advantest America R&D Center, Santa Clara, CA, USA
  • fYear
    2004
  • fDate
    28-30 Jan. 2004
  • Firstpage
    341
  • Lastpage
    346
  • Abstract
    An open architecture test system has been envisioned to address the re-usability of the test solutions. The open architecture provides a method and framework under which software and test instruments of different vendors can be developed and integrated into an automatic test equipment (ATE). The framework uses standard interfaces so that each modular unit (software or hardware) can be replaced with another modular unit from a different vendor. The basic structure of the Open Architecture Test System is described in this paper.
  • Keywords
    automatic test equipment; integrated circuit testing; multichip modules; parallel architectures; ATE; automatic test equipment; integrated circuit testing; modular unit; open architecture test system; standard interfaces; Application specific integrated circuits; Computer architecture; Costs; Hardware; Integrated circuit testing; Logic testing; Software testing; System testing; System-on-a-chip; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
  • Conference_Location
    Perth, WA, Australia
  • Print_ISBN
    0-7695-2081-2
  • Type

    conf

  • DOI
    10.1109/DELTA.2004.10026
  • Filename
    1409862