DocumentCode
2841751
Title
An overview of the open architecture test system
Author
Rajsuman, Rochit
Author_Institution
Advantest America R&D Center, Santa Clara, CA, USA
fYear
2004
fDate
28-30 Jan. 2004
Firstpage
341
Lastpage
346
Abstract
An open architecture test system has been envisioned to address the re-usability of the test solutions. The open architecture provides a method and framework under which software and test instruments of different vendors can be developed and integrated into an automatic test equipment (ATE). The framework uses standard interfaces so that each modular unit (software or hardware) can be replaced with another modular unit from a different vendor. The basic structure of the Open Architecture Test System is described in this paper.
Keywords
automatic test equipment; integrated circuit testing; multichip modules; parallel architectures; ATE; automatic test equipment; integrated circuit testing; modular unit; open architecture test system; standard interfaces; Application specific integrated circuits; Computer architecture; Costs; Hardware; Integrated circuit testing; Logic testing; Software testing; System testing; System-on-a-chip; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
Conference_Location
Perth, WA, Australia
Print_ISBN
0-7695-2081-2
Type
conf
DOI
10.1109/DELTA.2004.10026
Filename
1409862
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