• DocumentCode
    2841790
  • Title

    Fault diagnosis model research based on support vector regression and principal components analysis

  • Author

    Tian, WenJie ; Liu, JiCheng

  • Author_Institution
    Beijing Autom. Inst., Beijing Union Univ., Beijing, China
  • fYear
    2010
  • fDate
    26-28 May 2010
  • Firstpage
    3896
  • Lastpage
    3899
  • Abstract
    To overcome the deficiencies of low accuracy and high false alarm rate in fault diagnosis system, a new optimization method for f the fault diagnosis model is proposed based on support vector regression (SVR) and principal components analysis. Utilizing the character that principal components analysis algorithm can keep the discernability of original dataset after reduction, the reduces of the original dataset are calculated and used to train individual SVR classifier for ensemble, which increase the diversity between individual classifiers, and consequently, increase the detection accuracy. To validate the effectiveness of the proposed method, simulation experiments are performed based on the electronic circuit dataset. The results show that the proposed method is a promised ensemble method owning to its high diversity, high detection accuracy and faster speed in fault diagnosis.
  • Keywords
    fault diagnosis; optimisation; pattern classification; principal component analysis; regression analysis; support vector machines; SVR classifier; detection accuracy; electronic circuit dataset; false alarm rate; fault diagnosis model research; fault diagnosis system; optimization method; principal components analysis; support vector regression; Artificial neural networks; Automation; Diagnostic expert systems; Electronic circuits; Fault detection; Fault diagnosis; Home appliances; Parameter estimation; Principal component analysis; State estimation; Ensemble; Fault Diagnosis; Principal Components Analysis; Reduction; Support Vector Regression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference (CCDC), 2010 Chinese
  • Conference_Location
    Xuzhou
  • Print_ISBN
    978-1-4244-5181-4
  • Electronic_ISBN
    978-1-4244-5182-1
  • Type

    conf

  • DOI
    10.1109/CCDC.2010.5498471
  • Filename
    5498471