DocumentCode
2841793
Title
PARTITIONING HIERARCHICAL DESIGNS FOR TESTABILITY
Author
Abadir, Magdy ; Newman, Joe ; D´Souza, Deepak ; Spencer, Steve
fYear
1991
fDate
26-30 Oct 1991
Firstpage
174
Keywords
Circuit testing; Costs; Design for testability; Design methodology; Expert systems; Independent component analysis; Information analysis; Performance analysis; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519508
Filename
519508
Link To Document