DocumentCode :
2841793
Title :
PARTITIONING HIERARCHICAL DESIGNS FOR TESTABILITY
Author :
Abadir, Magdy ; Newman, Joe ; D´Souza, Deepak ; Spencer, Steve
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
174
Keywords :
Circuit testing; Costs; Design for testability; Design methodology; Expert systems; Independent component analysis; Information analysis; Performance analysis; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519508
Filename :
519508
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2841793
بازگشت