• DocumentCode
    2841874
  • Title

    Integrated MicroPhotonic wideband RF interference mitigation filter

  • Author

    Alameh, K. ; Bouzerdoum, A. ; Ahderom, S. ; Raisi, M. ; Eshraghian, K. ; Zhao, X. ; Zheng, R. ; Wang, Z.

  • Author_Institution
    Centre of Excellence for MicroPhotonics Syst., Edith Cowan Univ., Joondalup, WA, Australia
  • fYear
    2004
  • fDate
    28-30 Jan. 2004
  • Firstpage
    387
  • Lastpage
    390
  • Abstract
    MicroPhotonic broadband RF signal processors utilize true-time-delay methods to perform processing functions that cannot be achieved by conventional electronic methods. In addition to their small physical size and immunity to EMI, Photonic signal processors offer the possibility of delaying broadband RF signals with almost no loss. In this paper, we present a novel MicroPhotonic structure that integrates a photoreceiver array, a Vertical Cavity Surface Emitting Laser (VCSEL) array, and a multi-cavity optical substrate to realize a low-cost adaptive wideband RF interference mitigation filter. Results show that for a 64-cavity MicroPhotonic structure, high-resolution, tunable interference mitigation filter with a shape factor as low as 2 and passband ripples less than 0.25 dB can be realised.
  • Keywords
    integrated optics; integrated optoelectronics; microwave photonics; radiofrequency filters; radiofrequency interference; signal processing; surface emitting lasers; EMI; broadband RF signal processors; electromagnetic interference; electronic methods; integrated microphotonic wideband RF interference mitigation filter; multicavity optical substrate; passband ripples; photonic signal processors; photoreceiver array; radiofrequency; shape factor; time delay methods; vertical cavity surface emitting laser array; Adaptive arrays; Delay; Electromagnetic interference; Optical arrays; Optical filters; Optical losses; RF signals; Signal processing; Vertical cavity surface emitting lasers; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
  • Conference_Location
    Perth, WA, Australia
  • Print_ISBN
    0-7695-2081-2
  • Type

    conf

  • DOI
    10.1109/DELTA.2004.10029
  • Filename
    1409869