DocumentCode :
2841963
Title :
SEARCH STATE EQUIVALENCE FOR REDUNDANCY IDENTIFICATION AND TEST GENERATION
Author :
Giraldi, John ; Bushnell, Michael L.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
184
Keywords :
Acceleration; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Life estimation; Redundancy; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519509
Filename :
519509
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2841963
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