DocumentCode
2842258
Title
Low cost CPU I/O analyzer under system conditions
Author
Zobin, Genadly ; Sotman, Michael ; Kostinsky, Alexey
Author_Institution
WTM Sci. Center, Intel Israel, Haifa, Israel
fYear
2005
fDate
24-26 Oct. 2005
Firstpage
33
Lastpage
36
Abstract
This paper describes new methodology of component I/O testing under system conditions, enabling analog validation of modem buses without the need for full system functionality. The inexpensive implementation is appropriate for chips with IBIST-DFT functionality.
Keywords
analogue integrated circuits; built-in self test; system buses; test equipment; CPU I/O analyzer; I/O testing; IBIST-DFT functionality; analog validation; built-in self-test; design for testability; high speed bus validation; modem buses; Clocks; Costs; Design for testability; Frequency; Low voltage; Modems; Operating systems; System testing; Vehicles; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
Print_ISBN
0-7803-9220-5
Type
conf
DOI
10.1109/EPEP.2005.1563693
Filename
1563693
Link To Document