Title :
Model-order estimation and reduction of distributed interconnects via improved vector fitting
Author :
Min, Sung-Hwan ; Lee, Heeseok ; Song, Eunseok ; Choi, Yun-Seok ; Cho, Tae-je ; Kang, Sa-Yoon ; Oh, Se-Yong ; Swaminathan, Madhavan
Author_Institution :
Semicond. Bus., Samsung Electron. Co. Ltd., Gyounggi, South Korea
Abstract :
This paper introduces an automated method estimating and reducing the order of macromodel for fast transient simulation. The proposed method improves the vector fitting algorithm for extracting the reduced-order macromodel from the accurate macromodel having redundant poles and residues. The performance of the proposed method has been demonstrated through several test cases.
Keywords :
integrated circuit interconnections; transient analysis; vectors; distributed interconnects; model-order estimation; reduced-order macromodel; redundant poles; redundant residues; transient simulation; vector fitting; Admittance; Circuit simulation; Electromagnetic scattering; Equivalent circuits; Frequency dependence; Frequency response; Integrated circuit interconnections; Packaging; Power system interconnection; Scattering parameters;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
Print_ISBN :
0-7803-9220-5
DOI :
10.1109/EPEP.2005.1563696
