DocumentCode :
2842757
Title :
A Novel Digital Demodulation Method for MFEIT Based on APFFT
Author :
Jing, Guo ; Nan, Li ; Zhou, Zhou ; Wei, Yi ; Xin, Xu ; Yinan, Wang
Author_Institution :
ESSS Center, Nat. Univ. of Defense Technol. Changsha, Changsha, China
Volume :
1
fYear :
2010
fDate :
13-14 Oct. 2010
Firstpage :
112
Lastpage :
115
Abstract :
Electrical Impedance Tomography requires a high precision demodulator to estimate Amplitude and phase. Conventional digital quadrature demodulation performs well in single frequency Electrical Impedance Tomography. Because digital quadrature demodulator can only demodulate one single frequency signal at one time, it faces many problems when using in multi-frequency Electrical Impedance Tomography systems, multiple demodulators are needed or much more processing time is needed. The paper proposes a novel method All Phase Fast Fourier Transform demodulation for EIT system. All Phase Fast Fourier Transform algorithm improves the accuracy of Fast Fourier Transform Algorithm by using a special data truncation window. All Phase Fast Fourier Transform can get all the amplitudes and phases of different frequencies after one procedure. Then the performances of All Phase Fast Fourier Transform demodulator and digital quadrature demodulator are compared. According to the results, All Phase Fast Fourier Transform demodulation behaves better in amplitude and phase demodulation, especially in phase demodulation. In multi-frequency Electrical Impedance Tomography systems taking consideration of accuracy performance chiefly, All Phase Fast Fourier Transform demodulator should be the first choice.
Keywords :
amplitude estimation; demodulation; electric impedance imaging; fast Fourier transforms; APFFT; EIT system; MFEIT; all phase fast Fourier transform demodulation; amplitude estimation; data truncation window; digital quadrature demodulation method; frequency signal demodulation; high precision demodulator; multifrequency electrical impedance tomography system; phase demodulation; phase estimation; Accuracy; Demodulation; Fast Fourier transforms; Impedance; Time frequency analysis; Tomography; APFFT; Digital Quadrature Demodulation; EIT; MFEIT;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent System Design and Engineering Application (ISDEA), 2010 International Conference on
Conference_Location :
Changsha
Print_ISBN :
978-1-4244-8333-4
Type :
conf
DOI :
10.1109/ISDEA.2010.239
Filename :
5743141
Link To Document :
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