DocumentCode :
2842926
Title :
A Pulsed Approach for Electrical Impedance Spectroscopy Measurement
Author :
Ensheng, Dong ; Yilin, Jiang ; Wei, Guo ; Jianfei, Zhang
Author_Institution :
Aviation Control & Eng. Dept., Aviation Univ. of Air Force, Changchun, China
Volume :
1
fYear :
2010
fDate :
13-14 Oct. 2010
Firstpage :
150
Lastpage :
154
Abstract :
A pulsed method for impedance spectroscopy measurement, different from the traditional swept frequency methods, is presented. A string of square-wave pulses is digitally generated as the excitation signal to the sensing electrodes. A pulsed measurement system is described. A sample-collecting method for sampling the instantaneous response signals is implemented based on a field programmable gate arrays chip. The sampled data is further processed to obtain the impedance spectrum. Experiments are carried out for the measurement of electrical impedance spectroscopy of the demo electric circuits in order to inspect the feasibility of the pulsed measurement system. The preliminary experimental results indicate that the pulsed measurement system can effectively extract the electrical impedance spectroscopy information of the object detected. The proposed approach is feasible for evaluating the electrical impedance spectroscopy of the object detected.
Keywords :
electric impedance measurement; field programmable gate arrays; object detection; pulse measurement; sensors; spectroscopy; demo electric circuits; electrical impedance spectroscopy measurement; field programmable gate arrays chip; object detection; pulsed measurement system; sample-collecting method; sensing electrodes; swept frequency methods; Current measurement; Frequency measurement; Impedance; Impedance measurement; Pulse measurements; Semiconductor device measurement; FPGA; electrical impedance model; electrical impedance spectroscopy; pulse excitation; pulsed measurement system;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent System Design and Engineering Application (ISDEA), 2010 International Conference on
Conference_Location :
Changsha
Print_ISBN :
978-1-4244-8333-4
Type :
conf
DOI :
10.1109/ISDEA.2010.246
Filename :
5743150
Link To Document :
بازگشت