DocumentCode :
2843180
Title :
Scalable driver I/O macromodels for statistical analysis
Author :
Mutnury, Bhyrav ; Swaminathan, Madhavan ; Cases, Moises ; Pham, Nam ; De Araujo, Daniel N. ; Matoglu, Erdem
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2005
fDate :
24-26 Oct. 2005
Firstpage :
239
Lastpage :
242
Abstract :
In this paper, scalable driver I/O macromodels have been proposed for efficient signal integrity and timing analysis of today´s high-speed systems. Variations in semiconductor process, temperature, and power supply voltage affect the output voltage and current in driver circuits. The effect of these variations on driver and receiver circuits has been captured using Lagrange´s interpolation technique. In this paper, scalable macromodeling approach has been applied to differential driver circuits and single-ended driver and receiver circuits. Scalable driver and receiver circuits consume less CPU memory and simulation time compared to transistor-level driver and receiver circuits. The accuracy of scalable macromodels has been tested on various test cases for differential driver and single-ended driver-receiver circuits and results yielded good accuracy.
Keywords :
driver circuits; integrated circuit modelling; integrated circuit testing; interpolation; statistical analysis; I/O macromodels; Lagrange interpolation technique; differential driver circuits; receiver circuits; scalable macromodeling; semiconductor process; signal integrity; single-ended driver; statistical analysis; timing analysis; transistor-level driver; Circuit testing; Driver circuits; Interpolation; Lagrangian functions; Power supplies; Signal analysis; Statistical analysis; Temperature; Timing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
Print_ISBN :
0-7803-9220-5
Type :
conf
DOI :
10.1109/EPEP.2005.1563747
Filename :
1563747
Link To Document :
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