Title :
ON THE INTEGRATION OF DESIGN AND MANUFACTURING FOR IMPROVED TESTABILITY
Author :
Makki, Rafic Z. ; Daneshvar, Kasra ; Tranjan, Farid ; Greene, Richard
Keywords :
Circuit faults; Circuit testing; Costs; Design for testability; Integrated circuit interconnections; Manufacturing; Optical pulses; Pins; Ultra large scale integration; Very large scale integration;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519516
