DocumentCode
2843325
Title
Enhancement of characteristic temperature in In0.81Ga 0.19As/InGaAsP multiple quantum well laser operating at 1.74 μm for laser monitor
Author
Ubukata, Akinori ; Dong, Jie ; Matsumoto, Koh
Author_Institution
Tsukuba Labs., Nippon Sanso Corp., Ibaraki, Japan
fYear
1998
fDate
11-15 May 1998
Firstpage
721
Lastpage
724
Abstract
InGaAs/InGaAsP compressively strained quantum well lasers operating at 1.74 μm has been fabricated with the thin carrier blocking layers sandwiching the active layer for carrier confinement. The laser characteristic temperature (T0) of 85 K has been obtained, which is a high value in ever reported InGaAsP lasers in this wavelength range
Keywords
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; quantum well lasers; 1.74 mum; 85 K; In0.81Ga0.19As-InGaAsP; In0.81Ga0.19As/InGaAsP multiple quantum well laser; carrier confinement; characteristic temperature enhancement; thin carrier blocking layers; Carrier confinement; Indium gallium arsenide; Optical materials; Optical sensors; Optical waveguides; Photonic band gap; Quantum well lasers; Semiconductor lasers; Temperature; Waveguide lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location
Tsukuba
ISSN
1092-8669
Print_ISBN
0-7803-4220-8
Type
conf
DOI
10.1109/ICIPRM.1998.712744
Filename
712744
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