Title :
The development of the performance measuring system for the phase change heat transport device-heat pipe, vapor chamber and defrost plate
Author :
Lin, Wei-Keng ; Chao, Chen-I ; Tzou, Y.M. ; Chang, H.G.H. ; Wang, Paul
Author_Institution :
ESS Dept., Nat. Tsing-Hua Univ., Hsin-Chu, Taiwan
Abstract :
A multipurpose of the performance measuring system for the phase change heat transport device such as heat pipe, vapor chamber and defrost plate was designed in this study. The characteristic of this measuring system was using thermal electrical chip (T.E.C.) as the condenser. This paper also present experimental measurement of performance of a vapor chamber (VC), heat pipe and defrost plate. The vapor chamber, with square sides of 50 × 50mm and thickness of 3.5mm and 6mm, was sandwiched between a heater block and a cooling plate located on the evaporator and the condenser surface respectively. The performance of the vapor chamber was investigated by determining the thermal resistance over a heat input range of 1 to 5W in natural convection test with the condenser opens at ambient environment and up to 40W in force convection with the condenser held at constant temperature. The experimental results show that the Maximum heat dissipated ability was the same compare with the new design measuring system and the traditional heat pipe performance measuring system with a water jacket as the cooling condenser. The thermal resistance in natural convection condition for the axial direction was around 0.1°C/W, while the spray thermal resistance was 0.12°C/W. For the defrost plate, the axial thermal resistance was 0.17°C/W and 0.18°C/W for the spray thermal resistance.
Keywords :
forced convection; pipes; plates (structures); thermal resistance; axial thermal resistance; condenser; cooling plate; defrost plate; evaporator; force convection; heat pipe; performance measuring system; phase change heat transport device; spray thermal resistance; thermal electrical chip; thermal resistance; vapor chamber; Performance evaluation; Semiconductor device measurement; Temperature measurement; Thermal resistance; Water heating; heat pipe; spread thermal resistance; thermal resistance; vapor chambers;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4577-1387-3
Electronic_ISBN :
2150-5934
DOI :
10.1109/IMPACT.2011.6117272