• DocumentCode
    2843359
  • Title

    On chip circuit model for accurate mid-frequency simultaneous switching noise prediction

  • Author

    Zhou, Tingdong ; Strach, Thomas ; Becker, Wiren D.

  • Author_Institution
    IBM Corp., Austin, TX, USA
  • fYear
    2005
  • fDate
    24-26 Oct. 2005
  • Firstpage
    275
  • Lastpage
    278
  • Abstract
    An on chip circuit model for accurate mid-frequency simultaneous switching noise (SSN) prediction has been studied in this paper. Voltage controlled switching resistors, voltage controlled leakage resistors have been proposed to represent the switching activities and leakage of a chip. Empirical formulas are presented for the calculations of resistors. The on chip power grid impacts on mid-frequency SSN as well as the clock frequency noise have been analyzed. For mid-frequency SSN prediction, we don´t have to include on chip power grid in the model except an accurate intrinsic capacitance extraction. However, for clock-frequency noise, we need the on chip power grid characteristics.
  • Keywords
    integrated circuit modelling; integrated circuit noise; chip leakage; clock frequency noise; intrinsic capacitance extraction; mid-frequency SSN prediction; on chip circuit model; on chip power grid; simultaneous switching noise prediction; voltage controlled leakage resistors; voltage controlled switching resistors; Circuit noise; Clocks; Integrated circuit noise; Noise level; Packaging; Power grids; Predictive models; Resistors; Semiconductor device noise; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
  • Print_ISBN
    0-7803-9220-5
  • Type

    conf

  • DOI
    10.1109/EPEP.2005.1563757
  • Filename
    1563757