DocumentCode :
2843359
Title :
On chip circuit model for accurate mid-frequency simultaneous switching noise prediction
Author :
Zhou, Tingdong ; Strach, Thomas ; Becker, Wiren D.
Author_Institution :
IBM Corp., Austin, TX, USA
fYear :
2005
fDate :
24-26 Oct. 2005
Firstpage :
275
Lastpage :
278
Abstract :
An on chip circuit model for accurate mid-frequency simultaneous switching noise (SSN) prediction has been studied in this paper. Voltage controlled switching resistors, voltage controlled leakage resistors have been proposed to represent the switching activities and leakage of a chip. Empirical formulas are presented for the calculations of resistors. The on chip power grid impacts on mid-frequency SSN as well as the clock frequency noise have been analyzed. For mid-frequency SSN prediction, we don´t have to include on chip power grid in the model except an accurate intrinsic capacitance extraction. However, for clock-frequency noise, we need the on chip power grid characteristics.
Keywords :
integrated circuit modelling; integrated circuit noise; chip leakage; clock frequency noise; intrinsic capacitance extraction; mid-frequency SSN prediction; on chip circuit model; on chip power grid; simultaneous switching noise prediction; voltage controlled leakage resistors; voltage controlled switching resistors; Circuit noise; Clocks; Integrated circuit noise; Noise level; Packaging; Power grids; Predictive models; Resistors; Semiconductor device noise; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
Print_ISBN :
0-7803-9220-5
Type :
conf
DOI :
10.1109/EPEP.2005.1563757
Filename :
1563757
Link To Document :
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