DocumentCode :
2843418
Title :
AN APPROACH TO CHIP-INTERNAL CURRENT MONITORING AND MEASUREMENT USING AN ELECTRON BEAM TESTER
Author :
Helmreich, K. ; Nagel, P. ; Wolz, W. ; Muller-Glaser, K.D.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
256
Keywords :
Circuit testing; Current measurement; Electron beams; Electron emission; Magnetic field measurement; Magnetic fields; Monitoring; Semiconductor device measurement; Voltage measurement; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519517
Filename :
519517
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2843418
بازگشت