DocumentCode
2843550
Title
ROBUSTLY SCAN-TESTABLE CMOS SEQUENTIAL CIRCUITS
Author
Park, Bong-Hee ; Menon, Prem R.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
263
Keywords
Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; FETs; Fault detection; Latches; Robustness; Semiconductor device modeling; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519518
Filename
519518
Link To Document