Title : 
Model of Logical Difference Operation of Grade Upper Approximation Operator and Variable Precision Lower Approximation Operator
         
        
            Author : 
Zhang, Xianyong ; Mo, Zhiwen ; Xiong, Fang
         
        
            Author_Institution : 
Coll. of Math. & Software Sci., Sichuan Normal Univ., Chengdu, China
         
        
        
        
        
        
            Abstract : 
Precision and grade are two important quantitative indexes. The purpose of this paper is to combine precision and grade, and explore new extended rough set model. Based on logical difference operation of grade and precision, this paper proposes model of logical difference operation of grade upper approximation operator and variable precision lower approximation operator. In the new model, fundamental structure and properties are obtained by transformation formulas between variable precision approximations and graded approximations, furthermore regular algorithm and structural algorithm are proposed and analyzed. Finally a practical example is given to illustrate the model and the algorithms. The new model has extended variable precision rough set model, graded rough set model and classical rough set model, and so these models have obtained similar properties of approximation operators.
         
        
            Keywords : 
approximation theory; mathematical operators; rough set theory; grade upper approximation operator; graded approximation; logical difference operation; quantitative index; rough set model; transformation formulas; variable precision approximation; variable precision lower approximation operator; Algorithm design and analysis; Automation; Educational institutions; Intelligent structures; Mathematical model; Mathematics; Probabilistic logic; Quantization; Rough sets; Set theory;
         
        
        
        
            Conference_Titel : 
Computational Intelligence and Software Engineering, 2009. CiSE 2009. International Conference on
         
        
            Conference_Location : 
Wuhan
         
        
            Print_ISBN : 
978-1-4244-4507-3
         
        
            Electronic_ISBN : 
978-1-4244-4507-3
         
        
        
            DOI : 
10.1109/CISE.2009.5364945