Title : 
Model measurement of radar cross-section for fully coated target by variance in the size
         
        
            Author : 
Liu, Hongwei ; Shi, Zhendong ; Wu, Zhengde ; Antar, Yahia M. M.
         
        
            Author_Institution : 
Dept. of Microwave Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
         
        
        
        
        
        
            Abstract : 
Using dimensional analysis, geometric and physical optic approximation, a new method is suggested for electromagnetic scattering measurement of a lossy target. By this method, model measurement for radar cross-section (RCS) can be carried out at the same frequency with a prototype by variance in the size of model. This is significant for the lack of experimental equipment required or the problem of frequency dependency of radar absorbing materials on the objects. For the purpose of verification, the measurements of a cylinder are carried out at X band by means of a transition model. The computed results from models agree well with the measured data by the prototype itself
         
        
            Keywords : 
electromagnetic wave scattering; radar applications; radar cross-sections; EM scattering measurement; RCS measurement; X band measurements; dimensional analysis; electromagnetic scattering measurement; frequency dependency; fully coated target; geometric optic approximation; lossy target; model measurement; physical optic approximation; radar absorbing materials; radar cross-section; size variance; transition model; Electromagnetic analysis; Electromagnetic measurements; Electromagnetic scattering; Frequency measurement; Loss measurement; Optical losses; Physical optics; Prototypes; Radar cross section; Size measurement;
         
        
        
        
            Conference_Titel : 
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
0-7803-4308-5
         
        
        
            DOI : 
10.1109/ICMMT.1998.768317