Title :
Transistor requirements for direct-coupled transistor logic circuits
Author_Institution :
Bell Telephone Laboratories, Murray Hill
Keywords :
Circuit stability; Employment; Laboratories; Leakage current; Logic circuits; Telephony; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1956 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1956.1154464
