DocumentCode
2843859
Title
IGBT turn-off losses for hard switching and with capacitive snubbers
Author
Petterteig, Astrid ; Lode, Jon ; Undeland, Tore M.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Norwegian Inst. of Technol., Trondheim, Norway
fYear
1991
fDate
Sept. 28 1991-Oct. 4 1991
Firstpage
1501
Abstract
The authors present measured turn-off losses in IGBTs (insulated-gate bipolar transistors) from six different manufacturers. The rated breakdown-voltage and on-state current are 600 V and 75 A, respectively, for all transistors tested, except the IR-transistor which has 55 A as rate current. Hard switching and switching with a capacitive turn-off snubber are analyzed, both at 25 degrees C and 125 degrees C. The influence of variations in the gate resistance is covered. Conclusions from a similar set of measurements on 1000-1200 V IGBTs are also given. The loss reduction when using a turn-off snubber is larger than expected from experience with bipolar junction transistors. This is mainly due to the fact that the first part of the current fall time until the current tail is reached is shorter when a capacitive snubber is used than in hard switching. The turn-off losses increase strongly with temperature and also with the transistor current at turn-off. There is a significant increase in turn-off losses with increasing gate resistance.<>
Keywords
insulated gate bipolar transistors; losses; overvoltage protection; power transistors; switching; 1000 to 1200 V; 125 degC; 25 degC; 55 A; 600 V; 75 A; IGBT turn-off losses; IR-transistor; breakdown-voltage; capacitive snubbers; current fall time; current tail; gate resistance; hard switching; insulated-gate bipolar transistors; loss reduction; on-state current; Bridge circuits; Insulated gate bipolar transistors; MOSFET circuits; Power supplies; Pulse width modulation inverters; Snubbers; Switches; Tail; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1991., Conference Record of the 1991 IEEE
Conference_Location
Dearborn, MI, USA
Print_ISBN
0-7803-0453-5
Type
conf
DOI
10.1109/IAS.1991.178059
Filename
178059
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