• DocumentCode
    2843955
  • Title

    A high performance 1024 × 1024 digital x-ray panel with integrated readout electronics for nondestructive testing and medical imaging applications

  • Author

    Pan, Paul ; Petronio, Susan ; Schlesselmann, John ; Aziz, Naseem ; Chen, Albert ; Shieh, Wolf ; Tsai, Hsiung-Kuang

  • Author_Institution
    Flir Syst. Inc, Goleta
  • Volume
    5
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    3835
  • Lastpage
    3839
  • Abstract
    Prime View International (PVI) has developed a 4 times 4- inch digital X-ray panel with 1024 times 1024 resolution. The panel is built with a-Si PIN diodes and thin-film transistors (TFTs) for the detector array with readout integrated circuits (ROICs) from FLIR Systems Inc. The panel´s integrated electronics are capable of on-chip low-pass filtering, correlated double sampling, and programmable 9 to 14-bit analog-to-digital conversion. The detector panel is read out using eight FLIR System´s 128-channel 80-micrometer-pitch readout integrated circuits (ISC9717) abutted along the columns of the 1024 x 1024 detector array. The pixel size of detector array is 100 micrometers and fabricated by a standard TFT process plus an exclusive PIN process. This high performance, digitally integrated X-ray imaging solution is especially suitable to meet the rising demands of industrial nondestructive testing and medical imaging applications.
  • Keywords
    analogue-digital conversion; diagnostic radiography; digital integrated circuits; low-pass filters; nondestructive testing; p-i-n diodes; readout electronics; thin film transistors; FLIR Systems; Prime View International; a-Si PIN diode; correlated double sampling; detector array; digital X-ray panel; digitally integrated X-ray imaging; industrial nondestructive testing; integrated readout electronics; medical imaging; on-chip low-pass filtering; programmable analog-to-digital conversion; size 4 inch; thin-film transistor; Biomedical imaging; Detectors; Filtering; Low pass filters; Nondestructive testing; Readout electronics; Sampling methods; Sensor arrays; Thin film transistors; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4436957
  • Filename
    4436957