DocumentCode
2844373
Title
Complex bilateral finlines: a new analysis
Author
Fernandes, H.C.C.
Author_Institution
Dept. of Electr. Eng., Fed. Univ. of Rio Grande Norte
fYear
1998
fDate
1998
Firstpage
573
Lastpage
576
Abstract
An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness simultaneously at the first attempt. Also the concise Transverse Transmission Line-TTL-full wave method is used, in the analysis. New results of the complex propagation and of the characteristic impedance as a function of the frequency and different dimensions and conductivity of the substrate, are obtained in 3D
Keywords
fin lines; permittivity; waveguide theory; attenuation constant; characteristic impedance; complex bilateral finlines; complex propagation; conductivity; conductor thickness; effective dielectric constant; full wave method; semiconductor substrate; transverse transmission line; Attenuation; Boundary conditions; Conductors; Current density; Dielectric constant; Dielectric substrates; Electromagnetic fields; Equations; Finline; Impedance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-4308-5
Type
conf
DOI
10.1109/ICMMT.1998.768353
Filename
768353
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