Title : 
Electromagnetic field simulation of nonlinear microstrip line by FEM
         
        
            Author : 
Zhou, Shu-Ang ; Lewin, Thomas
         
        
            Author_Institution : 
Ericsson Components AB, Stockholm, Sweden
         
        
        
        
        
        
            Abstract : 
The paper presents a method for calculating the line resistance and inductance of nonlinear (normal or superconducting) microstrip lines from electromagnetic field analysis with the aid of the finite element method. Both nonlinear physical properties and geometric effects of the microstrip lines are taken into account in the basic formulation which generally results in a nonlinear integrodifferential equation for vector magnetic potential. A finite element numerical code is then developed to solve the integrodifferential equation. Illustratively, a numerical example is given to show how the nonlinear line resistance and inductance of a superconducting microstrip line can be extracted from the electromagnetic field solution
         
        
            Keywords : 
electromagnetic fields; finite element analysis; inductance; integro-differential equations; microstrip lines; superconducting microwave devices; superconducting transmission lines; FEM; electromagnetic field simulation; geometric effects; inductance; line resistance; nonlinear integrodifferential equation; nonlinear line resistance; nonlinear microstrip line; nonlinear physical properties; superconducting microstrip line; vector magnetic potential; Conductors; Electromagnetic fields; Finite element methods; High temperature superconductors; Inductance; Microstrip; Microwave filters; Superconducting filters; Superconducting microwave devices; Superconductivity;
         
        
        
        
            Conference_Titel : 
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
0-7803-4308-5
         
        
        
            DOI : 
10.1109/ICMMT.1998.768354