DocumentCode
2844394
Title
STUCK FAULT AND CURRENT TESTING COMPARISON USING CMOS CHIP TEST
Author
Storey, Tom ; Maly, Wojciech ; Andrews, John ; Miske, Myron
fYear
1991
fDate
26-30 Oct 1991
Firstpage
311
Keywords
CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Logic testing; Performance evaluation; Semiconductor device modeling; Semiconductor device testing; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519523
Filename
519523
Link To Document