Title :
Fields in the back plane of extended hemi-spherical lens
Author :
Dou, W.B. ; Sun, Z.L.
Author_Institution :
State Key Lab. of Millimeter Waves, Southeast Univ., Nanjing, China
Abstract :
In this paper, the fields distributions in the back plane of an extended hemispherical lens are calculated with the diffraction integration formula. Results are presented that show important properties versus oblique angle of incident plane wave and extension length: diffraction pattern, vectorial characteristics of fields, fields strength. The results provide much information on the imaging properties of the lenses at millimeter wavelengths
Keywords :
lenses; millimetre wave imaging; back plane; dielectric substrate lens; diffraction integration; electromagnetic field distribution; extended hemi-spherical lens; millimeter wave imaging; Dielectric substrates; Diffraction; Equations; Lenses; Optical imaging; Optical polarization; Optical refraction; Optical surface waves; Sun; Surface waves;
Conference_Titel :
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4308-5
DOI :
10.1109/ICMMT.1998.768374
