Title :
A distributed model of the saturation characteristics of integrated circuit transistors
Author :
Dickson, L. ; Happ, W.
Author_Institution :
Motorola Semiconductor Products Division, Phoenix, AZ, USA
Keywords :
Computational geometry; Dielectric substrates; Dielectric thin films; Electron emission; Equations; Integrated circuit modeling; NASA; Resistors; Silicon; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1967.1154520
