Title : 
Superconductivity opened and shielded microstrip
         
        
            Author : 
Fernandes, Humberto César Chaves ; De Brito Lima, Gustavo Adolfo ; Pereira, Wellton Pires
         
        
            Author_Institution : 
Dept. of Electr. Eng., Fed. Univ. of Rio Grande Norte, Natal, Brazil
         
        
        
        
        
        
            Abstract : 
The theory of the multilayer shielded and open microstrip lines considering the superconductor strip on semiconductor regions is presented. The Transverse Transmission Line (TTL) is used in the analysis. The superconductor effect is included with the boundary condition of the surface impedance that is related to the complex conductivity of the material, calculated from the advanced two-fluid model. Applying the moment method the complex propagation constant of the structure, including the phase constant and the attenuation constant, is obtained. Results are presented for the complex propagation constant, versus the frequency and the temperature, of this multilayer superconducting microstrip line
         
        
            Keywords : 
electromagnetic shielding; method of moments; microstrip lines; superconducting microwave devices; transmission line theory; attenuation constant; boundary condition; complex conductivity; complex propagation constant; moment method; multilayer superconducting microstrip line; phase constant; semiconductor substrate; shielding; surface impedance; transverse transmission line; two-fluid model; Boundary conditions; Microstrip; Nonhomogeneous media; Propagation constant; Strips; Superconducting materials; Superconducting transmission lines; Superconductivity; Surface impedance; Transmission line theory;
         
        
        
        
            Conference_Titel : 
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
0-7803-4308-5
         
        
        
            DOI : 
10.1109/ICMMT.1998.768378