Title :
Silicon versus germanium in picosecond logic circuits
Author :
Hill, F. ; Farber, Alex ; Yu, Haoyong
Author_Institution :
IBM Corporation, Yorktown Heights, NY, USA
Keywords :
Circuit testing; Delay effects; Germanium; Logic circuits; Packaging; Silicon; Switches; Switching circuits; Thin film transistors; Time measurement;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1967.1154543
