DocumentCode
2845123
Title
A Sub-Micro Pattern Analysis for Local Rotation, Gray-Scale Transformation and Gaussian Noise Invariant Texture Descriptors
Author
Srisuk, Sanun
Author_Institution
Dept. of Comput. Eng., Mahanakorn Univ. of Technol., Bangkok, Thailand
fYear
2009
fDate
14-16 Dec. 2009
Firstpage
112
Lastpage
117
Abstract
A new rotation invariant texture descriptor based on the difference of offset Gaussian (DooG) and a sub-micro pattern encoding are proposed. We first apply the Gabor wavelet to texture images. We then utilize the DooG to measure the difference between the center positive Gaussian and the neighbor rotated negative one. We encode the local micro texture using our proposed method, a sub-micro pattern analysis. In classification step, we convert the rotation problem to the circular shift one by applying the Trace transform on the encoding image to get another 2D image and then compute the circular shift invariant features in the Trace transform. A k-nearest neighbor classifier is employed to classify the shift invariant features. The proposed method is local rotation invariant texture descriptor and is robust to the additive Gaussian noise as a result of adapting the DooG. We evaluate the proposed method on the Brodatz album with respect to rotation and Gaussian noise. Experimental results have shown that our proposed method outperforms the recent texture analysis methods.
Keywords
Gaussian noise; image classification; image coding; image colour analysis; image texture; transforms; Brodatz album; Gabor wavelet; Gaussian noise invariant texture descriptor; Trace transform; additive Gaussian noise; circular shift invariant feature; difference of offset Gaussian; gray-scale transformation; image encoding; image texture; k-nearest neighbor classifier; local rotation; rotation invariant texture descriptor; submicro pattern analysis; submicro pattern encoding; Encoding; Gabor filters; Gaussian noise; Gray-scale; Image texture analysis; Kernel; Pattern analysis; Rotation measurement; Wavelet analysis; Wavelet transforms; sub-micro pattern analysis; texture analysis; trace transform; wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Multimedia, 2009. ISM '09. 11th IEEE International Symposium on
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-5231-6
Electronic_ISBN
978-0-7695-3890-7
Type
conf
DOI
10.1109/ISM.2009.26
Filename
5365033
Link To Document