• DocumentCode
    2845123
  • Title

    A Sub-Micro Pattern Analysis for Local Rotation, Gray-Scale Transformation and Gaussian Noise Invariant Texture Descriptors

  • Author

    Srisuk, Sanun

  • Author_Institution
    Dept. of Comput. Eng., Mahanakorn Univ. of Technol., Bangkok, Thailand
  • fYear
    2009
  • fDate
    14-16 Dec. 2009
  • Firstpage
    112
  • Lastpage
    117
  • Abstract
    A new rotation invariant texture descriptor based on the difference of offset Gaussian (DooG) and a sub-micro pattern encoding are proposed. We first apply the Gabor wavelet to texture images. We then utilize the DooG to measure the difference between the center positive Gaussian and the neighbor rotated negative one. We encode the local micro texture using our proposed method, a sub-micro pattern analysis. In classification step, we convert the rotation problem to the circular shift one by applying the Trace transform on the encoding image to get another 2D image and then compute the circular shift invariant features in the Trace transform. A k-nearest neighbor classifier is employed to classify the shift invariant features. The proposed method is local rotation invariant texture descriptor and is robust to the additive Gaussian noise as a result of adapting the DooG. We evaluate the proposed method on the Brodatz album with respect to rotation and Gaussian noise. Experimental results have shown that our proposed method outperforms the recent texture analysis methods.
  • Keywords
    Gaussian noise; image classification; image coding; image colour analysis; image texture; transforms; Brodatz album; Gabor wavelet; Gaussian noise invariant texture descriptor; Trace transform; additive Gaussian noise; circular shift invariant feature; difference of offset Gaussian; gray-scale transformation; image encoding; image texture; k-nearest neighbor classifier; local rotation; rotation invariant texture descriptor; submicro pattern analysis; submicro pattern encoding; Encoding; Gabor filters; Gaussian noise; Gray-scale; Image texture analysis; Kernel; Pattern analysis; Rotation measurement; Wavelet analysis; Wavelet transforms; sub-micro pattern analysis; texture analysis; trace transform; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia, 2009. ISM '09. 11th IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-5231-6
  • Electronic_ISBN
    978-0-7695-3890-7
  • Type

    conf

  • DOI
    10.1109/ISM.2009.26
  • Filename
    5365033