DocumentCode :
2845215
Title :
Brief introduction to an automatic measurement system for plotting Rieke diagram
Author :
Yixue, Wei ; Zhaotang, Zhang
Author_Institution :
Beijing Vacuum Electron. Res. Inst., China
fYear :
1998
fDate :
1998
Firstpage :
795
Lastpage :
798
Abstract :
A fast automatic measurement method of Rieke diagram that shows the output character of a microwave tube is put forward in this paper. One advanced principle and idea was presented to scan the impedance of Smith chart within VSWR=5. During the scanning course, data are sampled by one set of frequency and power gates, and all used to plot Rieke diagram. So this measurement system has fast speed to plot one piece of Rieke diagram in not more than 8 minutes
Keywords :
automatic testing; microwave measurement; microwave tubes; Rieke diagram; Smith chart; VSWR; automatic measurement; impedance scanning; microwave tube; Control systems; Frequency; Impedance; Microwave amplifiers; Microwave measurements; Power amplifiers; Power system stability; Pulse amplifiers; Regulators; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4308-5
Type :
conf
DOI :
10.1109/ICMMT.1998.768409
Filename :
768409
Link To Document :
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